Testing Complex and Embedded Systems by Kim H. Pries
ComputersWhat Testing Complex and Embedded Systems by Kim H. Pries is worth on the used-book market.
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Item details
- UPC / EAN
- 1351689002
- Brand
- Kim H. Pries
- Author
- Kim H. Pries
- Published
- 2010
- Publisher
- Taylor & Francis Group
- Pages
- 319
- ISBN
- 1351689002
- Editions
- 7
Testing Complex and Embedded Systems resale value
Testing Complex and Embedded Systems by Kim H. Pries (2010). Across 7 editions. Used-book value depends heavily on edition (first printing vs. reprint), condition, dust jacket, and whether it's signed. First editions and out-of-print titles command the biggest premiums.
What drives the price
First editions/first printings, intact dust jackets, signatures, and unmarked pages are the top value drivers. Book-club editions and later reprints are worth far less.
Frequently asked questions
- Is this 2010 edition still relevant for modern embedded systems work?
- As a foundational text, it provides core knowledge from 2010, which is valuable for understanding complex system testing principles.
- What is the ISBN for this specific edition?
- The ISBN for this 7th edition is 1351689002.
- How many pages does the book contain?
- The book, "Testing Complex and Embedded Systems," is 319 pages long.
