Applied Measurement with JMetrik by J. Patrick Meyer

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What Applied Measurement with JMetrik by J. Patrick Meyer is worth on the used-book market.

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Item details

UPC / EAN
0415531977
Brand
J. Patrick Meyer
Author
J. Patrick Meyer
Published
2014
Publisher
Routledge
Pages
149
ISBN
0415531977
Editions
7

Applied Measurement with JMetrik resale value

Applied Measurement with JMetrik by J. Patrick Meyer (2014). Across 7 editions. Used-book value depends heavily on edition (first printing vs. reprint), condition, dust jacket, and whether it's signed. First editions and out-of-print titles command the biggest premiums.

What drives the price

First editions/first printings, intact dust jackets, signatures, and unmarked pages are the top value drivers. Book-club editions and later reprints are worth far less.

Frequently asked questions

Is this 2014 edition still relevant for modern measurement studies?
As a foundational text published in 2014, it offers established principles in applied measurement.
What is the ISBN for this specific edition?
The ISBN for this book is 0415531977.
How many pages are in this book?
This edition contains 149 pages.

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