Applied Measurement with JMetrik by J. Patrick Meyer
ComputersWhat Applied Measurement with JMetrik by J. Patrick Meyer is worth on the used-book market.
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Item details
- UPC / EAN
- 0415531977
- Brand
- J. Patrick Meyer
- Author
- J. Patrick Meyer
- Published
- 2014
- Publisher
- Routledge
- Pages
- 149
- ISBN
- 0415531977
- Editions
- 7
Applied Measurement with JMetrik resale value
Applied Measurement with JMetrik by J. Patrick Meyer (2014). Across 7 editions. Used-book value depends heavily on edition (first printing vs. reprint), condition, dust jacket, and whether it's signed. First editions and out-of-print titles command the biggest premiums.
What drives the price
First editions/first printings, intact dust jackets, signatures, and unmarked pages are the top value drivers. Book-club editions and later reprints are worth far less.
Frequently asked questions
- Is this 2014 edition still relevant for modern measurement studies?
- As a foundational text published in 2014, it offers established principles in applied measurement.
- What is the ISBN for this specific edition?
- The ISBN for this book is 0415531977.
- How many pages are in this book?
- This edition contains 149 pages.